Japanese Journal of Applied Physics 57(11S) 2018年11月
YO1.5-doped HfO2 films were deposited on yttria-stabilized zirconia substrates by RF magnetron sputtering at room temperature and under various atmosphere conditions. The deposited films were treated by rapid thermal annealing under both O-2 and N...
The thickness dependences of the crystal structure and electric properties of (111)-oriented epitaxial 0.07Y(2)O(3)-HfO2 (YHO7) ferroelectric films were investigated for the film thickness range of 10-115 nm. The YHO7 films were grown by pulsed la...
The dependence of applied rectangular pulses with various widths on the crystal structure change was investigated by time-resolved synchrotronbased X-ray diffraction measurement. A (001)-oriented epitaxial Pb(Zr0.5Ti0.5)O-3 film of 2.1 mu m thickn...
Japanese Journal of Applied Physics 56(10S) 2017年10月
Local response signals in scanning nonlinear dielectric microscopy during domain switching in ferroelectric materials were studied. Periodic response signals corresponding to domain switching were observed in single-crystal LiTaO3 samples under al...
Japanese Journal of Applied Physics 55(10S) 2016年10月
BaCe0.9Y0.1O3-delta (BCYO) and SrZr0.8Y0.2O3-delta (SZYO) thin films of perovskite-type oxides were deposited on (111) Pt/TiOx/SiO2/(100) Si substrates. X-ray diffraction patterns showed that the (110)-oriented BCYO and SZYO thin films were grown ...